Title:
スキャン内ダイナミックレンジを改善するための可変窓バンドパスフィルタリングを使用する調査スキャンからのイオンの除去
Document Type and Number:
Japanese Patent JP5889403
Kind Code:
B2
Abstract:
Systems and methods are used to band-pass filter ions from a mass range. A full spectrum is received for a full scan of a mass range using a tandem mass spectrometer. A mass selection window of the full spectrum is selected and a set of tuning parameter values is selected. The tandem mass spectrometer is instructed to perform a scan of the mass selection window using the set of tuning parameter values. A spectrum is received for the scan from the tandem mass spectrometer. A band-pass filtered spectrum is created for the mass range that includes values from the spectrum for the mass selection window of the mass range. Systems and methods are also used to band-pass filter ions from two or more mass selection windows across the mass range and to filter out ions from a mass selection window between two band-pass mass selection windows.
Inventors:
Tate, Stephen A.
Bloomfield, Nick G.
Bloomfield, Nick G.
Application Number:
JP2014513264A
Publication Date:
March 22, 2016
Filing Date:
May 30, 2012
Export Citation:
Assignee:
DA Technologies Development Private Limited
International Classes:
H01J49/42; G01N27/62
Domestic Patent References:
| JP2005221276A |
Attorney, Agent or Firm:
Hidesaku Yamamoto
Natsuki Morishita
Natsuki Morishita