Title:
Ｘ線撮影装置
Document Type and Number:
Japanese Patent JP6460226
Kind Code:
B2
Abstract:
In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.
Inventors:
Koichi Tanabe
Shingo Furui
Toshinori Yoshimuta
Kenji Kimura
Akihiro Nishimura
Taro Shirai
Takahiro Toki
Satoshi Sano
Horiba Himei
Toshiyuki Sato
Shingo Furui
Toshinori Yoshimuta
Kenji Kimura
Akihiro Nishimura
Taro Shirai
Takahiro Toki
Satoshi Sano
Horiba Himei
Toshiyuki Sato
Application Number:
JP2017511496A
Publication Date:
January 30, 2019
Filing Date:
March 01, 2016
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
A61B6/00; G01T1/20; G21K1/00; G21K1/06
Domestic Patent References:
| JP2013164339A | ||||
| JP2012228371A | ||||
| JP201237352A | ||||
| JP2008224661A |
Foreign References:
| US5812629 |
Attorney, Agent or Firm:
Tsutomu Sugiya
Hiroyuki Todaka
Tomohiko Sugitani
Kurihara Kaname
Nobuyoshi Aono
Hiroyuki Todaka
Tomohiko Sugitani
Kurihara Kaname
Nobuyoshi Aono