Title:
３次元計測装置、３次元計測方法、及びプログラム
Document Type and Number:
Japanese Patent JP6529372
Kind Code:
B2
Inventors:
Lee Yukaku
Zhu Lin
Toshiaki Sato
Kikuo Tachibana
Masahiko Tsuguchi
Zhu Lin
Toshiaki Sato
Kikuo Tachibana
Masahiko Tsuguchi
Application Number:
JP2015148009A
Publication Date:
June 12, 2019
Filing Date:
July 27, 2015
Export Citation:
Assignee:
Pasco Co., Ltd.
International Classes:
G01C11/06
Domestic Patent References:
| JP20146148A | ||||
| JP2007322170A | ||||
| JP2001141454A | ||||
| JP5322567A | ||||
| JP200385541A | ||||
| JP2005156514A | ||||
| JP2013108927A |
Foreign References:
| US20120300070 |
Attorney, Agent or Firm:
Haruka International Patent Office