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Title:
分解能飽和に起因する畳み込みを検出するためのTOF抽出の振幅のグループ化
Document Type and Number:
Japanese Patent JP6599452
Kind Code:
B2
Abstract:
Sample molecules are ionized producing a beam of ions using an ion source. A plurality of ion extractions are performed on the beam of ions using a TOF mass spectrometer. Electrical detections from each extraction are measured using an ADC, producing a mass sub-spectrum for each extraction. An ion m/z from the plurality of mass sub-spectra is selected. For each mass sub-spectrum, the amplitude and m/z of an ion within a m/z tolerance of the ion m/z is assigned to the corresponding amplitude band of a plurality of predetermined amplitude bands, producing a plurality of amplitude and m/z values for the each amplitude band. For each amplitude band of the plurality of predetermined amplitude bands, the plurality of amplitude and m/z values are combined into a peak, resulting in a plurality of peaks corresponding to the plurality of predetermined amplitude bands.

Inventors:
Bloomfield, Nick G.
Application Number:
JP2017518983A
Publication Date:
October 30, 2019
Filing Date:
September 21, 2015
Export Citation:
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Assignee:
DA Technologies Development Private Limited
International Classes:
G01N27/62; H01J49/26; H01J49/40
Domestic Patent References:
JP2013525986A
JP2005302622A
JP2004317509A
Foreign References:
WO2008008867A2
US20050023454
Attorney, Agent or Firm:
Hidesaku Yamamoto
Natsuki Morishita