Title:
光学特性測定装置および光学特性測定方法
Document Type and Number:
Japanese Patent JP6678901
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To correspond to the miniaturization and cost reduction of an apparatus even when measuring optical properties of an object to be measured at a high speed with high accuracy.SOLUTION: An apparatus 10 for measuring optical properties comprises: an elliptical transmission dome 14 including a curved surface equivalent to a part of spheroid 14c having a first focus 14a and a second focus 14b and formed of a material having optical transparency of reflecting a part of irradiated light and transmitting the other part thereof; a mirror reflection plate 15 for specularly reflecting light reflected on the curved surface in the elliptical transmission dome 14 out of light emitted from an object 1a to be measured positioned at the first focus 14a to condense the light at a mirror image inversion position 15b of the second focus 14b; and a light receiving part 13 for receiving the light at the mirror image inversion part 15b to provide the light receiving results to the measurement of the distribution characteristics of the light from the object 1a to be measured.SELECTED DRAWING: Figure 2
Inventors:
Hiroyuki Yokota
Application Number:
JP2016091317A
Publication Date:
April 15, 2020
Filing Date:
April 28, 2016
Export Citation:
Assignee:
Tokyo Metropolitan Industrial Technology Research Center
International Classes:
G01M11/00; G01M11/02; G01N21/17
Domestic Patent References:
| JP20132966A | ||||
| JP2009165137A | ||||
| JP2014507665A | ||||
| JP201432371A |
Foreign References:
| US5637873 |
Attorney, Agent or Firm:
Aniya Setsuo
Fukuoka Masahiro
Okuyama Tomohiro
Hideo Tachibana
Fukuoka Masahiro
Okuyama Tomohiro
Hideo Tachibana