Title:
分析データ処理装置
Document Type and Number:
Japanese Patent JP6683015
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To improve the accuracy of analysis by reducing a phenomenon that when a large peak appears in a detection signal obtained by a TOFMS detector, a baseline sinks immediately after the peak.SOLUTION: An averaging processing unit 172 performs an averaging process using an IIR filer having a small time constant on the basis inputted data and calculates a baseline correction value, and a subtraction unit 173 subtracts the correction value from the original data and thereby obtains data having had subduction corrected. Since a new averaging process is executed only when it is determined by a data selection unit 74 that the inputted data value falls within a prescribed range where the magnitude, etc., of subduction is taken into account for an immediate baseline correction value, it is possible to appropriately correct subduction of a relatively large temporal change without being affected by an intrinsic peak.SELECTED DRAWING: Figure 2
Inventors:
Naoya Ueda
Suzuki Hayai
Suzuki Hayai
Application Number:
JP2016104838A
Publication Date:
April 15, 2020
Filing Date:
May 26, 2016
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N35/00; G01N27/62
Domestic Patent References:
| JP2010527019A | ||||
| JP2009008582A | ||||
| JP11153588A | ||||
| JP1129659U | ||||
| JP2007005303A | ||||
| JP2003061961A | ||||
| JP2010234059A | ||||
| JP2012205250A | ||||
| JP6066567A |
Foreign References:
| WO2012039061A1 | ||||
| US6112161 |
Attorney, Agent or Firm:
Kyoto International Patent Office