Title:
０度入射絶対反射率測定装置
Document Type and Number:
Japanese Patent JP6696642
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an improved absolute reflectance measurement technique with 0 degree incidence.SOLUTION: An absolute reflectance measurement apparatus 10 has a first light guide mirror 16 and a second light guide mirror 18 which transmit some of an incident light and reflect the other of it. Sample mounting means 14 includes a central stage 28 on which a sample 24 is mounted, a first rotating table 30 which rotates around the central stage 28, and a second rotating table 32 which rotates around the first rotating table 30. The first light guide mirror 16 and the second light guide mirror 18 are disposed on the first rotating table 30. A detector 26 is disposed on the second rotating table 32. A first preliminary measurement in which the transmittance of the first light guide mirror 16 and the reflectance of the second light guide mirror 18 are measured, a second preliminary measurement in which the reflectance of the first light guide mirror 16 and the transmittance of the second light guide mirror 18 are measured, a first sample measurement in which the sample is measured with the first light guide mirror 16, and a second sample measurement in which the sample is measured with the second light guide mirror 18 are performed to measure an absolute reflectance of the sample in a substantially vertical direction.SELECTED DRAWING: Figure 1
Inventors:
Soga Junken
Takashi Yamanishi
Ichitaro Takashita
Takashi Yamanishi
Ichitaro Takashita
Application Number:
JP2016207896A
Publication Date:
May 20, 2020
Filing Date:
October 24, 2016
Export Citation:
Assignee:
JASCO Corporation
International Classes:
G01N21/55
Domestic Patent References:
| JP159144A | ||||
| JP2004198244A | ||||
| JP58195141A | ||||
| JP7120385A | ||||
| JP5097477U |
Attorney, Agent or Firm:
Yuji Iwahashi
Shinji Kato
Shinji Kato