Title:
顕微鏡用スライドガラスの曲面の高さの測算方法及び顕微鏡
Document Type and Number:
Japanese Patent JP6746722
Kind Code:
B2
Abstract:
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard microscope slide is used as a template to obtain heights of all standard measurement points on another microscope slide to be measured. The method is realized through a conversion relationship of a functional equation set of coordinates and the heights. In the present invention, a height on a curved surface of any microscope slide can be measured accurately; and the method for measuring the height on the curved surface is applied to an automatic scanning microscope to realize fast micro image scan of samples on the microscope slide. Particularly under a high-magnification lens, advantages of high imaging definition, high scanning speed, high efficiency and automation are more outstanding.
Inventors:
YIN, Yuefeng
Application Number:
JP2018564821A
Publication Date:
August 26, 2020
Filing Date:
December 04, 2016
Export Citation:
Assignee:
YIN, Yuefeng
International Classes:
G02B21/34
Domestic Patent References:
| JP5332761A | ||||
| JP2008500586A | ||||
| JP2012203048A |
Attorney, Agent or Firm:
Kaji/Suhara Patent Office