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Patent Searching and Data


Title:
計測装置及び計測方法
Document Type and Number:
Japanese Patent JP6782470
Kind Code:
B2
Abstract:
A measurement apparatus includes a light source, an interferometer, a light receiver, and a signal processor. The light source emits laser light to a scatterer in the atmosphere. The laser light has multiple oscillation frequencies separated from each other at equal frequency intervals. The interferometer produces interference in scattered light generated as a result of the laser light being scattered by the scatterer. The light receiver receives Mie scattered light included in the scattered light subjected to the interference produced by the interferometer and generates a signal. The signal processor detects the quantity of the Mie scattered light based on the signal. Each of the equal frequency intervals is smaller than the full width at half maximum of the peak of a frequency spectrum of Rayleigh scattered light. The Rayleigh scattered light is generated as a result of the laser light being scattered by molecules forming the atmosphere.

Inventors:
Tatsushi Oyama
Mariko Miyashita
Application Number:
JP2019139109A
Publication Date:
November 11, 2020
Filing Date:
July 29, 2019
Export Citation:
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Assignee:
Panasonic IP Management Co., Ltd.
International Classes:
G01N21/49; G01B9/02
Domestic Patent References:
JP2019158348A
Foreign References:
US20190018115
WO2016208013A1
Other References:
環境用画像計測,システム/制御/情報,日本,システム制御情報学会 The Institute of Systems,Con,1994年 1月15日,Vol. 38, No. 1,pp. 48-53
Field-compensated tunable Mach-Zehnder interferometer for a multi-mode high-spectral-resolution lida,PROCEEDINGS OF SPIE,米国,SPIE,2018年 7月24日,Vol. 10827,108272O,doi: 10.1117/12.2500403
Attorney, Agent or Firm:
Hiromori Arai
Eisaku Teratani
Shinichi Michisaka