Title:
半導体素子の状態監視装置
Document Type and Number:
Japanese Patent JP6805623
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a state monitor for semiconductor element, capable of monitoring a detailed state of a semiconductor element.SOLUTION: A state monitor 100 of a semiconductor element 202 includes: a partial-voltage part 4 which detects a state of the semiconductor element 202 included in a power conversion part 201 and outputs a voltage corresponding to a state of the semiconductor element 202; a plurality of comparators 5 (5a-5c) into which a voltage output from the partial-voltage part 4 is input and which compares the input voltage to reference values A1-A3 and outputs the comparative result.SELECTED DRAWING: Figure 1
Inventors:
Hiroshi Endo
Hiroshi Shinohara
Hiroshi Shinohara
Application Number:
JP2016160320A
Publication Date:
December 23, 2020
Filing Date:
August 18, 2016
Export Citation:
Assignee:
Fuji Electric Co., Ltd.
International Classes:
H02M7/48
Domestic Patent References:
| JP58108789U | ||||
| JP2013026769A | ||||
| JP2000125463A | ||||
| JP11041912A | ||||
| JP2013070532A | ||||
| JP2003009509A | ||||
| JP2012147646A | ||||
| JP9238476A |
Attorney, Agent or Firm:
Hirokazu Miyazono