Title:
光干渉ユニットおよび光干渉測定装置
Document Type and Number:
Japanese Patent JP6826496
Kind Code:
B2
Abstract:
A light interference unit (20) includes a branching optical element (21), a multiplexing optical element (23), and at least one fiber device (22). The branching optical element (21) branches a laser light for which an emission wavelength is temporally swept, into a measurement light and a reference light. The multiplexing optical element multiplexes the reference light and the measurement light reflected by an object to be measured, and causes the reference light and the measurement light to interfere. The at least one fiber device includes a reference light device (22A). A transmission light path length is defined by a light path length of the reference light, which transmits the reference light device, from the reference light device to the multiplexing optical element. A reflection light path length is defined by a light path length of the reference light, which is reflected by a separation portion of the reference light device, from the reference light device to the multiplexing optical element. In this case, the transmission light path length is equal to or more than the reflection light path length.
Inventors:
High Mayato
Shinya Iwata
Shinya Iwata
Application Number:
JP2017112500A
Publication Date:
February 03, 2021
Filing Date:
June 07, 2017
Export Citation:
Assignee:
Tatsuta Electric Wire Co., Ltd.
NIDEK CORPORATION
NIDEK CORPORATION
International Classes:
A61B3/10; G01B9/02; G01B11/24; G01N21/17
Domestic Patent References:
| JP2008128926A | ||||
| JP2015198757A | ||||
| JP2001264246A | ||||
| JP2016011935A | ||||
| JP2011133388A | ||||
| JP2001227911A | ||||
| JP2006266696A |
Foreign References:
| US20130308097 | ||||
| US20160367134 |
Attorney, Agent or Firm:
Tomoya Okawa