Title:
異常予測方法、異常予測装置、異常予測システムおよび異常予測プログラム
Document Type and Number:
Japanese Patent JP6854151
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a method to predict if any abnormality occurs in future.SOLUTION: An abnormality predicting device 10 extracts process data contained in an analysis frame, that is, prescribed time width Wa, from process data which are time-sequence data collected by sensors of a monitored object facility. Then, the abnormality predicting device 10 calculates a frame abnormality evaluation value, that is, an interim evaluation value expressing a probability of abnormality occurrence at a time prescribed period after a prescribed time, by using a learning model predicting abnormality of the monitored object facility whose inputs are the extracted process data. Finally, the abnormality predicting device 10 calculates a predicted abnormality evaluation value which is a final evaluation value expressing the probability of abnormality occurrence at a time prescribed period after a prescribed time, on the basis of the plural calculated frame abnormality evaluation values.SELECTED DRAWING: Figure 1
Inventors:
Tomonori Izumiya
Keisuke Kiritsudori
Keisuke Kiritsudori
Application Number:
JP2017034028A
Publication Date:
April 07, 2021
Filing Date:
February 24, 2017
Export Citation:
Assignee:
NTT Communications Corporation
International Classes:
G05B23/02
Domestic Patent References:
| JP2016173782A | ||||
| JP2016157280A | ||||
| JP2016045852A |
Attorney, Agent or Firm:
Sakai International Patent Office