Title:
制御システム、制御プログラムおよび制御方法
Document Type and Number:
Japanese Patent JP6919186
Kind Code:
B2
Abstract:
A technique enables shorter-cycle monitoring of a phenomenon in a control target. A controller includes a feature quantity generation unit that generates, from data associated with a control target, a feature quantity appropriate for detecting an abnormality in the control target, a machine learning unit that performs machine learning using the feature quantity, an abnormality detection unit that detects the abnormality based on an abnormality detection parameter determined from a learning result of the machine learning, and the feature quantity, an instruction unit that instructs the abnormality detection unit to detect the abnormality, and a data compression unit that compresses data about the feature quantity and provides the compressed data to the machine learning unit and the abnormality detection unit. The instruction unit transmits a request for detecting the abnormality to the abnormality detection unit. The abnormality detection unit detects the abnormality without returning a response to the request.
Inventors:
Shinsuke Kawanoue
Yoshihide Nishiyama
Yoshihide Nishiyama
Application Number:
JP2016242303A
Publication Date:
August 18, 2021
Filing Date:
December 14, 2016
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G05B23/02; G05B19/05
Domestic Patent References:
| JP2011070635A | ||||
| JP2010009369A | ||||
| JP6052474A | ||||
| JP11175142A | ||||
| JP2002408A |
Attorney, Agent or Firm:
Fukami patent office