Title:
高周波測定方法及び高周波測定装置
Document Type and Number:
Japanese Patent JP6922934
Kind Code:
B2
Abstract:
With a conventional high-frequency measurement method, it is difficult to accurately grasp variation in high-frequency performance when a high-frequency signal is input to an amplifier. One aspect of a high-frequency measurement method according to the present invention includes generating a test signal (TS), which is a sine-wave signal having a predetermined frequency, in which a period (τ) during which the power level is at a first power level and a period (T-τ) during which the power level is at a second power level lower than the first power level are periodically repeated, inputting the test signal (TS) to a device under test (10) as an input signal, and measuring the difference between an output signal (OUT) of the device under test (10) and an ideal value of the output signal (OUT).
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Inventors:
Yuji Murao
Application Number:
JP2018566764A
Publication Date:
August 18, 2021
Filing Date:
November 20, 2017
Export Citation:
Assignee:
NEC
International Classes:
G01R31/3183; G01R31/26
Foreign References:
| US20060066394 |
Other References:
Yuanxiao Gou, Maoliu Lin, Jiahui Fu, Qun Wu,Extraction and Validation of Power Amplifiers' Harmonics Dynamic X-Parameters From Pulsed Envelope Domain Measurements,IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,2014年,2900-2910頁
P. Draxler, I. Langmore, T.P. Hung, P.M. Asbeck ,Time Domain Characterization of Power Amplifiers with Memory Effectcs,IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST,2003年,803-806頁
P. Draxler, I. Langmore, T.P. Hung, P.M. Asbeck ,Time Domain Characterization of Power Amplifiers with Memory Effectcs,IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST,2003年,803-806頁
Attorney, Agent or Firm:
Ken Ieiri