Title:
測定装置及び精度管理方法
Document Type and Number:
Japanese Patent JP7352340
Kind Code:
B2
Abstract:
Disclosed is a measurement apparatus that includes: a measurement unit configured to measure a control sample for quality control; a display unit; and a processing unit configured to cause the display unit to display an input screen for setting an evaluation criterion used in the quality control, and, in the measurement apparatus, the processing unit causes the display unit to display a quality control result of a test item, based on the evaluation criterion and a measurement result of the control sample.
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Inventors:
Yodai Tachiya
Ki Nishi
Tomoyu Tsuji
Yasuaki Tsuruoka
Hijiri Yoneda
Ki Nishi
Tomoyu Tsuji
Yasuaki Tsuruoka
Hijiri Yoneda
Application Number:
JP2018185295A
Publication Date:
September 28, 2023
Filing Date:
September 28, 2018
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N35/00
Domestic Patent References:
| JP2000187037A | ||||
| JP2007078375A | ||||
| JP2016070833A | ||||
| JP2016540969A | ||||
| JP2003004750A | ||||
| JP6875137B2 | ||||
| JP2018531367A |
Foreign References:
| WO2018142871A1 |
Attorney, Agent or Firm:
Saegusa International Patent Office