Title:
異常検知装置、および異常検知方法
Document Type and Number:
Japanese Patent JP7417426
Kind Code:
B2
Abstract:
To easily detect an abnormality generated in a photographing environment from an image of a product.SOLUTION: An abnormality detection device 1 includes: a conversion part 12 that converts each of a plurality of images acquired from a camera 2 into a spectrum in a space frequency wavelength region; a model application part 13 that applies a non-linear model having an inflection point to the converted spectrum; an extraction part 14 that extracts a space frequency corresponding to the inflection point from the non-linear model applied to the spectrum; an evaluation value calculation part 15 that calculates and outputs an evaluation value indicating a quality of each of the plurality of images on the basis of the space frequency corresponding to the extracted inflection point; a storage part 16 that stores time series data on the evaluation value for the plurality of images output from the evaluation value calculation part 15; and a time series analysis part 17 that performs a time series analysis of the stored time series data, and determines that an abnormality occurs in a photographing environment containing the camera 2 and is structured in advance when a result of the time series analysis satisfies a predetermined condition.SELECTED DRAWING: Figure 1
Inventors:
Masaki Kitazawa
Minegishi Hironori
Kazuichi Higuchi
Guo Fengxiang
Minegishi Hironori
Kazuichi Higuchi
Guo Fengxiang
Application Number:
JP2020004289A
Publication Date:
January 18, 2024
Filing Date:
January 15, 2020
Export Citation:
Assignee:
Azbil Corporation
International Classes:
H04N23/60
Foreign References:
| WO2019167044A1 | ||||
| WO2018106799A1 |
Attorney, Agent or Firm:
Shigeki Yamakawa
Masaki Yamakawa
Masaki Yamakawa