Title:
【発明の名称】容量素子の容量―電圧特性への影響量を測定する回路及び方法
Document Type and Number:
Japanese Patent JPH04503112
Kind Code:
A
Abstract:
PCT No. PCT/EP90/00612 Sec. 371 Date Sep. 25, 1991 Sec. 102(e) Date Sep. 25, 1991 PCT Filed Apr. 17, 1990 PCT Pub. No. WO90/13793 PCT Pub. Date Nov. 15, 1990.A circuit and a method for measuring a quantity influencing the capacitance-voltage characteristic of a capacitive element, the measuring accuracy and the signal-to-noise-ratio being improved by determining such quantity on the basis of the area under the curve of the capacitance-voltage characteristic.
Inventors:
Schonenberg, Ube
Bostrich, Hostica
McCray, Jordan
Zimmer, Gunter
Bostrich, Hostica
McCray, Jordan
Zimmer, Gunter
Application Number:
JP50596390A
Publication Date:
June 04, 1992
Filing Date:
April 17, 1990
Export Citation:
Assignee:
Fraunhofer-Gesellschaft Tour Felderung der Angevanten Forsung Eingetragener Fehlein
International Classes:
G01D5/24; G01N27/22; G01R27/26; (IPC1-7): G01R27/26; G01N27/22
Attorney, Agent or Firm:
Tomijio Sasashima