Title:
【発明の名称】テストデータ編集装置
Document Type and Number:
Japanese Patent JPH0827806
Kind Code:
B2
Abstract:
PURPOSE:To ensure the easy input check of test data by displaying graphically the test data corresponding to an external terminal pin of an integration circuit in a waveform when the data on said pin is displayed via a display means. CONSTITUTION:A MPU 24 stores temporarily each data inputted from a keyboard 21 in a memory 23 and at the same time performs the normal display of a pin name and its attribute via a display device 22 together with the test pattern data displayed graphically in a waveform. In this case, the MPU 24 displays the waveform as well as the state (H or L) of a language type set at the time of key input for the test data on a pin having a signal output attribute. Thus an operator can easily recognize both signal input and output pins based on the character of H or L displayed on the picture of the device 22.
Inventors:
Yumiko Sato
Hideki Iwamura
Hideki Iwamura
Application Number:
JP7640588A
Publication Date:
March 21, 1996
Filing Date:
March 31, 1988
Export Citation:
Assignee:
富士通株式会社
富士通ヴィエルエスアイ株式会社
富士通ヴィエルエスアイ株式会社
International Classes:
G06F11/25; G06F11/26; G06F17/50; (IPC1-7): G06F17/50; G06F11/25
Attorney, Agent or Firm:
Aoki Akira (3 outside)
Next Patent: テストデータ編集装置