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Title:
FIXTURE USED FOR CIRCUIT SUBSTRATE TEST SYSTEM
Document Type and Number:
Japanese Patent JPS58137773
Kind Code:
A
Abstract:

PURPOSE: To cope with a future pattern change, by providing preliminarily through holes, through which additional test probes should be inserted, in additional test probe positions other than test probe attaching positions.

CONSTITUTION: Test probes 6W8 corresponding to all test points of a preliminarily determined number of kinds of PC board pattern are provided on a well 5 consisting of insulating materials such as a glass-epoxy resin. Terminals 6cW8c of test probes 6W8 are connected to a wiring post 14 through lead-in wires 10W 12. The well 5 is provided preliminarily with through holes 40 through which probes to be added in future are inserted. These through holes 40 can be provided in optional positions other than positions of probes 6W8, are ordinarily, they are provided in positions where parts may be added. Consequently, probes are attached to positions of through holes 40 corresponding to additional test points to cope with the addition of new parts.


Inventors:
OGATA MITSUNORI
MACHINO YASUO
HARASHIMA TAKASHI
AOYAMA KIYOUYA
Application Number:
JP2039782A
Publication Date:
August 16, 1983
Filing Date:
February 10, 1982
Export Citation:
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Assignee:
EMU AI TECHNICAL SERVICE KK
International Classes:
G01R1/073; G01R31/28; (IPC1-7): G01R31/28
Attorney, Agent or Firm:
Kyozo Yuasa



 
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