Document Type and Number:
Japanese Patent JPWO2021161405
Kind Code:
A1
Abstract:
Provided is an abnormal data generation device capable of generating highly accurate abnormal data. The abnormal data generation device includes an abnormal data generation unit for generating pseudo generated data of abnormal data that has, in the same latent space, a normal distribution as a normal data generation model and an abnormal distribution expressed as a complementary set of the normal distribution and that is optimized such that pseudo generated data cannot be discriminated from observed actual abnormal data by a latent variable sampled from the abnormal distribution.
Application Number:
JP2021577751A
Publication Date:
August 19, 2021
Filing Date:
February 12, 2020
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