Title:
ABNORMAL EVENT DIAGNOSTIC SYSTEM, ABNORMAL EVENT DIAGNOSTIC METHOD AND PROGRAM
Document Type and Number:
Japanese Patent JP2022020555
Kind Code:
A
Abstract:
To provide a system which detects an abnormal event and identifies kinds of the detected abnormal event.SOLUTION: An abnormal event diagnostic system comprises a learned model which learns a relation between a parameter calculated when a simulator reproduces an abnormal event and the abnormal event in AI (artificial intelligence) processing, a data acquisition unit which acquires the parameter for monitoring a plant and a diagnostic unit which detects the abnormal event on the basis of a value about which the learned model outputs and identifies kinds of the detected abnormal event when inputting the parameter for monitoring to the learned model.SELECTED DRAWING: Figure 1
Inventors:
OTSUKI SHOHEI
SUMITA HIROYUKI
MATSUMOTO ATSUSHI
SHIMIZU KENTA
TSUBOUCHI KIYOHIKO
MORITA KATSUAKI
OTSUKA KATSUHIKO
FUJIWARA KAZUYA
SUMITA HIROYUKI
MATSUMOTO ATSUSHI
SHIMIZU KENTA
TSUBOUCHI KIYOHIKO
MORITA KATSUAKI
OTSUKA KATSUHIKO
FUJIWARA KAZUYA
Application Number:
JP2021096048A
Publication Date:
February 01, 2022
Filing Date:
June 08, 2021
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G05B23/02
Attorney, Agent or Firm:
Yasushi Matsunuma
Eisuke Ito
Hiroyuki Hashimoto
Ancient city Satoshi
Koichiro Kamada
Eisuke Ito
Hiroyuki Hashimoto
Ancient city Satoshi
Koichiro Kamada