Title:
ABNORMALITY DETERMINATION MODEL GENERATION METHOD, ABNORMALITY DETERMINATION MODEL GENERATION DEVICE AND INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2022040531
Kind Code:
A
Abstract:
To provide an abnormality determination model generation method, an abnormality determination model generation device and an inspection device which can newly add various types of learning data, and can enhance the reliability of inspection of abnormality which appears in an external appearance, even when there is a small amount of abnormal teacher image data.SOLUTION: An abnormality determination model generation method which generates an abnormality determination model for determining abnormality of an inspection object by considering inspection image data obtained by measuring the inspection object as input data includes steps of: generating a learning dataset (Img_tch) for generating the abnormality determination model on the basis of pseudo data (Img_fak) imitating a feature pattern of the abnormality of the inspection object; and generating the abnormality determination model by using the learning dataset (Img_tch).SELECTED DRAWING: Figure 4
Inventors:
NAKAZATO KENICHI
Application Number:
JP2020145295A
Publication Date:
March 11, 2022
Filing Date:
August 31, 2020
Export Citation:
Assignee:
BOSCH GMBH ROBERT
International Classes:
G06T7/00; G01N21/88
Attorney, Agent or Firm:
Reiji Oba
Hajime Takahashi
Go Yashima
Hajime Takahashi
Go Yashima
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