Title:
ABNORMALITY PROBE SUPPORT DEVICE
Document Type and Number:
Japanese Patent JP2009199590
Kind Code:
A
Abstract:
To provide an abnormality probe support device which is excellent in convenience while satisfying that a site worker can work with both hands while directly viewing an infrared image even in a situation such that the worker's visual field is disturbed by smoke of fire or the like.
The abnormality probe support device includes an infrared camera and a display which is located in the front of the eyes at least when using the infrared camera and reproduces an image taken by the infrared camera, the both being provided on a face protector or helmet. The infrared camera is disposed in the vicinity of one eye on an extension of a line connecting both the eyes.
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Inventors:
MIYANO NAOKI
ISHIBASHI FUMIO
ISHIBA YOSHIHISA
KAWANISHI NOBORU
TAKADA TAKESHI
SHIMIZU EIJI
TAKAHASHI HIDEYA
ISHIBASHI FUMIO
ISHIBA YOSHIHISA
KAWANISHI NOBORU
TAKADA TAKESHI
SHIMIZU EIJI
TAKAHASHI HIDEYA
Application Number:
JP2009014748A
Publication Date:
September 03, 2009
Filing Date:
January 26, 2009
Export Citation:
Assignee:
SHARP KK
YAMAMOTO KOGAKU
SHIMIZU EIJI
TAKAHASHI HIDEYA
YAMAMOTO KOGAKU
SHIMIZU EIJI
TAKAHASHI HIDEYA
International Classes:
G08B21/00; A42B3/30; G08B25/00; G08B25/10; H04N7/18; A62B17/00
Domestic Patent References:
| JPH04370207A | 1992-12-22 | |||
| JP2002264874A | 2002-09-18 | |||
| JPH11133348A | 1999-05-21 | |||
| JP2000030175A | 2000-01-28 |
Attorney, Agent or Firm:
Kazuyoshi Tsujimoto