Title:
ABNORMALITY PROCESSING METHOD FOR PROCESS CONTROL SYSTEM
Document Type and Number:
Japanese Patent JPH01216412
Kind Code:
A
Abstract:
PURPOSE:To construct a tough process control system by prohibiting an abnormality processing when abnormality continues until a time set on a timer for a process input/output device (Pio) elapses. CONSTITUTION:When it is decided that the abnormality is generated in the Pio2 judging from reception data from the Pio, a master device 1 performs control on a system by transmitting data before generating the abnormality to the Pio in which the abnormality is generated, and transferring the latest data among other Pios. And when the abnormality exists after the lapse of a set timer time (it is different from each Pio), the master device 1 performs the abnormality processing as the system, and when the Pio in which the abnormality is generated is recovered within the set timer time, it performs the same control on the system similarly as before the generation of the abnormality. In such a way, it is possible to prevent system down from being generated easily, and to heighten reliability for the process control system.
Inventors:
SUMIKAWA TAKESHI
Application Number:
JP4114988A
Publication Date:
August 30, 1989
Filing Date:
February 24, 1988
Export Citation:
Assignee:
FUJI FACOM CORP
International Classes:
G05B9/02; G05D9/02; (IPC1-7): G05D9/02
Attorney, Agent or Firm:
Iwao Yamaguchi
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