To provide an AD converter measuring circuit capable of using an LSI tester that does not need a DC measuring unit to perform a test in short period of time in testing an AD converter.

This AD converter measuring circuit is provided with a DA converter 204 for converting a digital signal into an analog signal and inputting the analog signal to an AD converter 102 of a measuring object, a counter 208 for generating an expected value of an output of the AD converter 102, and an EX-OR gate 211 and a flip-flop 212 for comparing an actual measured value being the output of AD converter 102 with the expected value being an output of the counter 208 and outputting a comparison result. In addition, the AD converter measuring circuit has an accuracy correction circuit 401 consisting of a flip-flop 402 for shifting a signal of the comparison result and an AND gate 404 for receiving the comparison result and an output of the flip-flop 402.