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Title:
ADAPTIVE ERROR CORRECTION FOR NON-VOLATILE MEMORIES
Document Type and Number:
Japanese Patent JP2014044791
Kind Code:
A
Abstract:

To provide adaptive error correction for non-volatile memories.

Methods and systems are disclosed for adaptive error correction for non-volatile memories that dynamically adjust sense amplifier read detection windows. Memory control circuitry uses error correction code (ECC) routines to detect bit errors that are non-correctable using these ECC routines. The memory control circuitry then dynamically adjusts sense amplifier read detection windows to allow correct data to be determined. Corrected data can then be output to external circuitry. The corrected data can also be stored for later access when subsequent read operations attempt to access address locations that previously had bit failures. The disclosed methods and systems can also be used with respect to memories that are not non-volatile memories.


Inventors:
CUNNINGHAM JEFFREY C
HORACIO P GASQUET
ROSS S SCOULLER
MARCO A CABASSI
Application Number:
JP2013173131A
Publication Date:
March 13, 2014
Filing Date:
August 23, 2013
Export Citation:
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Assignee:
FREESCALE SEMICONDUCTOR INC
International Classes:
G11C29/42; G06F12/16; G11C16/02; G11C16/06
Domestic Patent References:
JP2010123236A2010-06-03
JP2011108306A2011-06-02
JP2009515281A2009-04-09
JP2010529557A2010-08-26
Foreign References:
WO2011028235A12011-03-10
US20070091677A12007-04-26
US20070201274A12007-08-30
US20080307270A12008-12-11
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Shinsuke Onuki



 
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