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Title:
ADJUSTING METHOD OF PARTICLE BEAM IRRADIATION APPARATUS AND IRRADIATION FIELD FORMING DEVICE
Document Type and Number:
Japanese Patent JP2004321830
Kind Code:
A
Abstract:

To improve uniformity of radiation quantity distribution in an affected area.

A particle beam curing apparatus 1 comprises a charged particle beam generating device 2 and an irradiation field forming device 15. An ion beam from the charged particle beam generating apparatus 2 is irradiated on the affected area 62 through the irradiation field forming apparatus 15. On a downstream side of a first and a second scanning electromagnets 17, 18, a scattering body device 19 integrated with a flying distance adjusting device 20, and a Bragg peak enlarging device 21 solely, each mounted on the irradiation field forming device 15, are moved on a beam axis 14. Movement of the scattering body device 19 adjusts scattering degree of the ion beam. Movement of the flying distance adjusting device 20 adjusts a change of the scattering degree according to absorber's thickness adjustment. Movement of the Bragg peak enlarging device 21 adjusts a change of the scattering degree aroused according to an SOBP apparatus 21. Because of these adjustment, radiation quantity distribution in the affected area is uniformalized.


Inventors:
YANAGISAWA MASAKI
AKIYAMA HIROSHI
MATSUDA KOJI
FUJIMAKI HISATAKA
Application Number:
JP2004230056A
Publication Date:
November 18, 2004
Filing Date:
August 06, 2004
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
A61N5/10; G21K1/10; G21K3/00; G21K5/00; H05H13/04; G21K1/093; G21K5/04; (IPC1-7): A61N5/10; G21K1/093; G21K3/00; G21K5/00; G21K5/04
Attorney, Agent or Firm:
Yasuo Sakuta