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Title:
ANALOG TYPE CALENDAR FOR TEST-TAKER
Document Type and Number:
Japanese Patent JP2008173948
Kind Code:
A
Abstract:

To provide an analog type calendar for test-takers raising strong will to study without doing trifles because there is not enough time by strongly making them recognize the residual time to examinations from the early time of test-taking preparation by visually and viscerally showing the residual time to the examinations showing what position of the test-taking schedule the test-takers are on now.

Annual calendars with an analog type expression have a period of three years or six years according to the schedule of the test-takers. What position from start to a goal of the test-taking study the test-takers are on can be visually and viscerally grasped by showing 12 month plan and 31 day plan separately.


Inventors:
KONYA YOSHIFUMI
Application Number:
JP2007034090A
Publication Date:
July 31, 2008
Filing Date:
January 18, 2007
Export Citation:
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Assignee:
MEIRIKAI KONTANI CLINIC
International Classes:
B42D5/04; G04B19/00
Domestic Patent References:
JPS53107872A1978-09-20