Title:
電子放出特性の解析システム及び解析方法
Document Type and Number:
Japanese Patent JP5301861
Kind Code:
B2
Inventors:
What a moral
Keizo Suzuki
Norihiro Uemura
Shunichiro Nobiki
Tatsuya Miyake
Shunsuke Mori
Yoshiro Mikami
Kazutaka Tsuji
Masatoshi Shiiki
Keizo Suzuki
Norihiro Uemura
Shunichiro Nobiki
Tatsuya Miyake
Shunsuke Mori
Yoshiro Mikami
Kazutaka Tsuji
Masatoshi Shiiki
Application Number:
JP2008085871A
Publication Date:
September 25, 2013
Filing Date:
March 28, 2008
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01R29/24; H01J9/42; G09G3/288; H01J1/32; H01J11/38; H01J11/40; H01J11/44
Domestic Patent References:
| JP2005071858A | ||||
| JP2007134151A | ||||
| JP2002033053A |
Other References:
S. Ho et al.,"Numerical Analysis of Density of Energy States for Electron Emission Sources in MgO",Proceedings of IDW '08,2008年12月 5日,PDP3-3,p. 1869-1872
S. Ho et al.,"Discharge Probability Model for Analyzing Formative Delay Time and Electron Emission Properties of MgO in PDPs",Proceedings of IDW '07,2007年12月 6日,PDP2-3,p. 807-810
S. Ho et al.,"Discharge Probability Model for Analyzing Formative Delay Time and Electron Emission Properties of MgO in PDPs",Proceedings of IDW '07,2007年12月 6日,PDP2-3,p. 807-810
Attorney, Agent or Firm:
Yamato Tsutsui