Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
集束させるミクロ構造のアレイを備えた分析デバイス
Document Type and Number:
Japanese Patent JP2009520350
Kind Code:
A
Abstract:
A device includes first and second material facing towards each other as to form at least one focusing microstructure with a focal point located outside of the first material.

More Like This:
JP2005292623PELLICLE
JP2006133784LITHOGRAPHY APPARATUS AND DEVICE MANUFACTURING METHOD
JP5559270A level sensor arrangement, a lithography device, and a device manufacturing method for lithography devices
Inventors:
Dirksen, Peter
Accenoff, Yuri
Van den havefel, fredericus sey
Quainten, Johannes AYM
Application Number:
JP2008545239A
Publication Date:
May 21, 2009
Filing Date:
December 15, 2006
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
H01L21/027; C40B60/04; G01N37/00; G03F7/20; C12M1/00
Domestic Patent References:
JP2004033654A2004-02-05
JP2004528910A2004-09-24
JPH1030983A1998-02-03
JP2003084219A2003-03-19
JPH11274073A1999-10-08
JPS63175744A1988-07-20
Foreign References:
WO2005010960A12005-02-03
US6585939B12003-07-01
Attorney, Agent or Firm:
Tadahiko Ito
Shinsuke Onuki
Tadashige Ito



 
Previous Patent: 統合された高電圧ダイオード及びその製造方法

Next Patent: 銀めっきに超音波を使用する方法