Title:
分析業務支援装置、分析業務支援方法および分析業務支援プログラム
Document Type and Number:
Japanese Patent JP7079660
Kind Code:
B2
Abstract:
To provide an analysis work support device capable of achieving appropriate analysis of work information while reducing complexity and preventing personalization, and the like.SOLUTION: In an embodiment, an analysis work support device generates an analysis screen on which a display region which operates as a next analysis trigger and can be specified by an operator is set as an analysis screen corresponding to an initial analysis related to a sales target contrast per business office, displays the generated screen on a monitor, and generates an analysis screen corresponding to the next analysis related to income and expenditure achievements per department and displays the generated screen on the monitor when the operator specifies, for example, a display region of a specifiable business office name "Tokyo".SELECTED DRAWING: Figure 11
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Inventors:
Yasuhiro Miya
Shunpei Yazaki
Kohei Hamamura
Takemitsu Ueno
Shunpei Yazaki
Kohei Hamamura
Takemitsu Ueno
Application Number:
JP2018098927A
Publication Date:
June 02, 2022
Filing Date:
May 23, 2018
Export Citation:
Assignee:
Obic Co., Ltd.
International Classes:
G06Q10/06
Domestic Patent References:
JP2011248435A | ||||
JP2014137698A | ||||
JP2016146205A | ||||
JP2012059074A |
Attorney, Agent or Firm:
Sakai International Patent Office
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