Title:
ANALYZING DEVICE
Document Type and Number:
Japanese Patent JPH03191324
Kind Code:
A
Abstract:
PURPOSE:To easily detect the voltage application area of this device to be observed with high sensitivity and high resolution by fixing an optical translucent material to an observation microscope. CONSTITUTION:The optical translucent material 4 provided with an optical translucent electrode 3 is fixed to the microscope, i.e. objective 7 by a fixture 6 and the device 2 to be observed which is coated with liquid crystal 5 is observed. This optical translucent material may be fixed to a microscope main body other than the objective and the shape of the fixture is not referred to. Consequently, the best focus for the device is obtained to make a clear observation with high resolution, and a voltage is applied uniformly to the entire surface of the device, so high sensitivity is realized. Consequently, the voltage application area on the device can be detected by the simple constitution with the high sensitivity and high resolution.
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Inventors:
KUMADA TOSHIAKI
Application Number:
JP33182289A
Publication Date:
August 21, 1991
Filing Date:
December 20, 1989
Export Citation:
Assignee:
SEIKO INSTR INC
International Classes:
G01R19/155; G02B21/00; G02F1/13; (IPC1-7): G01R19/155; G02B21/00; G02F1/13
Attorney, Agent or Firm:
Keinosuke Hayashi