To provide analyzing equipment for accurately detecting minute changes in the resonance angle.

The analyzing equipment is provided with a metal film 1 contacting a sample 2, a light source 4 for generating a light 24 irradiated on a side opposite to the sample 2 on the metal film 1, and a light detection means 6 for detecting intensity of the reflected light 26 from the metal film 1, and analyzes the sample 2, by utilizing surface plasmon resonance generated, when the metal film 1 is irradiated with the light at a given incident angle θ. The analyzer equipment is also provided with an optical means 5 for making the metal film 1 irradiated with the light several times, by having the metal film 1 irradiated with the reflected light from the metal film 1. The light detection means 6 can detect the intensity of the reflected light 26, after the metal film 1 is irradiated by the optical means 5 with the reflected light a several number of times.