Title:
ABNORMALITY DETECTION SYSTEM
Document Type and Number:
Japanese Patent JP2023089923
Kind Code:
A
Abstract:
To provide an abnormality detection system for a facility apparatus, which is, with a simple configuration without using any sensor that requires power supply, capable of accurately detecting an abnormality in the facility apparatus.SOLUTION: An abnormality detection system 1 includes a facility apparatus-side device 2 and an abnormality detection device 3. The facility apparatus-side device 2 includes: a vibration power generation sensor 21 that is set so that its resonance frequency is a frequency of vibration generated when a facility apparatus operates normally, and that generates power by vibrations generated by the facility apparatus; and a transmitting unit 25 that, each time an amount of power obtained by the vibration power generation sensor 21 reaches a power threshold, consumes the amount of power and transmits a signal. The abnormality detection device 3 includes a receiving unit 31 that receives the signal, and a diagnosis unit 34 that diagnoses whether or not an operating state of the facility apparatus is abnormal based on a time interval of receiving the signal.SELECTED DRAWING: Figure 2
Inventors:
IGARASHI SAYAKA
UCHIYAMA YASUO
YAMAMOTO MASARU
UCHIYAMA YASUO
YAMAMOTO MASARU
Application Number:
JP2022144338A
Publication Date:
June 28, 2023
Filing Date:
September 12, 2022
Export Citation:
Assignee:
TAISEI CORP
International Classes:
G01M99/00; G01H17/00
Attorney, Agent or Firm:
Sonoda & Kobayashi Patent Attorneys Corporation
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