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Title:
APPARATUS FOR INSPECTING FILM
Document Type and Number:
Japanese Patent JP2006064541
Kind Code:
A
Abstract:

To provide an apparatus for inspecting a film, capable of accurately inspecting various dispersion properties of particles dispersed in the film.

The apparatus is equipped with a light source (illumination 200) which is disposed on one surface side of a light transmissive film wherein the particles are dispersed; an imaging means (camera 100) which is disposed on the other surface side of the film and acquires a transmission image of the film; a means 350 for making minute particles explicit, which makes the minute particles explicit from an original image acquired by the imaging means and generates an explicit image of the minute particles; a means 360 for making large particles explicit, which makes the large particles explicit from the original image and generates an explicit image of the large particles; an inspection image generating means 370 which generates an inspection image from the explicit images of the minute particles and large particles; and a property computing means 380 which computes properties of particles in the inspection image.


Inventors:
YABUNAKA TOMOYA
HAMADA TOKUA
KOBAYASHI MOTOO
SAKAMOTO TOSHIHIRO
Application Number:
JP2004247464A
Publication Date:
March 09, 2006
Filing Date:
August 26, 2004
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES
International Classes:
G01B11/02; G01N15/06; G06T1/00
Domestic Patent References:
JP2003222584A2003-08-08
JP2003083868A2003-03-19
JPS63128878A1988-06-01
JPH04346305A1992-12-02
JP2004037134A2004-02-05
JPS5587114A1980-07-01
JPH0933449A1997-02-07
JP2002189164A2002-07-05
JPS57212405A1982-12-27
Attorney, Agent or Firm:
Hiroshi Yamano