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Title:
APPARATUS FOR MEASURING POLARIZATION AND DOUBLE REFRACTION
Document Type and Number:
Japanese Patent JP3159743
Kind Code:
B2
Abstract:

PURPOSE: To obtain the title apparatus suitable for measuring the polarization state of a lens.
CONSTITUTION: A lens 20 to be inspected is immersed in a matching solution 63 having a refractive index almost same to that of the lens 20 to be inspected and not having optical activity and polarized beam having a predetermined expanse is allowed to be incident to the lens 20 to be inspected. The beam transmitted through the lens 20 to be inspected is taken in a two-dimensional CCD image sensor 40 and the analyser 30 provided between the lens 20 to be inspected and the CCD image sensor 40 is rotated in order to change the quantity of transmitted beam and the quantity of the beam taken in the CCD image sensor 40 is analyzed at every pixel to measure a polarization state and double refraction.


Inventors:
Masato Noguchi
Go Ishikawa
Application Number:
JP26426191A
Publication Date:
April 23, 2001
Filing Date:
July 11, 1991
Export Citation:
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Assignee:
Asahi Optical Co., Ltd.
International Classes:
G01M11/00; G01M11/02; G01N21/23; (IPC1-7): G01M11/00
Domestic Patent References:
JP28727A
JP1165928A
Attorney, Agent or Firm:
Tamio Nishiwaki