Title:
APPARATUS FOR MEASURING AND RECORDING FREQUENCY VARIATION OF TOTAL CAPACITANCE AND CONDUCTANCE OF THIN FILM
Document Type and Number:
Japanese Patent JPS5439694
Kind Code:
A
Abstract:
Apparatus and method whereby ultra low frequency dielectric measurements allow a determination to be made of the parameters (dielectric constant, thickness and conductivity) characterizing electrically distinct layers with membranes such as bimolecular lipid or protein membranes (i.e. the major components of the membranes of living cells). The location and effect of chemicals such as anaesthetics, tranquilizers, hormones and other substances of pharmacological and general biological interest which are adsorbed into these or other membranes can be determined. The effects of these chemicals can be quantitatively specified in terms of this effect of the substructural dielectric parameters.
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Inventors:
HANSU JIERAADO REONAADO KOOSUT
ROBAATO JIYOFUREI ATSUSHIYUKUR
JIYON ROBAATO SUMISU
ROBAATO JIYOFUREI ATSUSHIYUKUR
JIYON ROBAATO SUMISU
Application Number:
JP7313778A
Publication Date:
March 27, 1979
Filing Date:
June 16, 1978
Export Citation:
Assignee:
UNISEARCH LTD
International Classes:
G01N27/02; G01N27/04; G01N27/22; G01N33/00; G01N33/487; G01R27/02; G01R27/26; (IPC1-7): A61B5/00; G01N27/04; G01N27/22; G01N33/00; G01R27/02