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Patent Searching and Data


Title:
APPARATUS AND METHOD FOR ANALYZING OPTICAL COMPONENT
Document Type and Number:
Japanese Patent JPH0320637
Kind Code:
A
Abstract:

PURPOSE: To make it possible to accurately measure with excellent reproducibility by switching and connecting the electric input of a light wave source and electric output of a light wave receiver to a predetermined constitution via a switch matrix.

CONSTITUTION: An optical component analyzer 10 has a light wave test set 12 having a light wave receiver and a light wave source. Light wave test ports 121 to 123 are provided at the set 12. The analyzer 10 also has an electric test set 18 for electrically measuring. Electric test ports 181, 182 are provided at the set 18. Further, the analyzer 10 is assembled, in addition to the source and receiver, with a switch matrix. The optical calibration and test measurement are conducted by connecting between the ports 121 and 122 of the set 12, and electric (E/E), electro-optical (E/O), electro-optical (O/E) or optical (O/O) device can be simply measured.


Inventors:
POORU AARU HAANDEI
ROJIYAA DABURIYU UONGU
BIYUUGO BIFUIAN
Application Number:
JP2815090A
Publication Date:
January 29, 1991
Filing Date:
February 06, 1990
Export Citation:
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Assignee:
HEWLETT PACKARD CO
International Classes:
G01R31/26; G01M11/00; G01R31/00; G02B6/00; (IPC1-7): G01M11/00; G01R31/00; G01R31/26; G02B6/00
Attorney, Agent or Firm:
Hasegawa Tsugio