Title:
APPARATUS AND METHOD FOR EVALUATION OF MATERIAL BY USING POSITIVE ELECTRONS
Document Type and Number:
Japanese Patent JP3448636
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain an apparatus and a method, for the evaluation of a material by using positive electrons, in which the S/N ratio and the time resolution of the evaluation are high even when a positive-electron-beam source is separated from the material to be measured and in which the crystallinity of the material to be measured can be evaluated precisely in a comparatively short time.
SOLUTION: In this material evaluation apparatus 10, a positive-electron-beam source 1, an electromagnetic lens 3, a positive electron detector 5, a first γ-ray detector 7-1 and a second γ-ray detector 7-2 are provided. Then, positive electrons which are emitted from the positive-electron-beam source 1 are focused in the direction of a material 6, to be measured, by a magnetic field which is generated by the electromagnetic lens 3. In addition, the inside of a vacuum container 2 is vacuum-evacuated through an evacuation port 8. Therefore, a positive-electron flying route up to the material 6, to be measured, from the positive-electron-beam source 1 is maintained to be vacuum. The life of the positive electrons is measured on the basis of the time which elapses until γ-rays emitted from the material 6 to be measured are detected by the γ-ray detectors 7-1, 7-2 since the positive electronc are passed through the positive electron detector 5.
Inventors:
Taiji Shirai
Hideki Araki
Hideki Araki
Application Number:
JP24852499A
Publication Date:
September 22, 2003
Filing Date:
September 02, 1999
Export Citation:
Assignee:
Osaka University
International Classes:
G01N23/22; (IPC1-7): G01N23/22
Other References:
柚賀正雄 他，アバランシェ・フォトダイオード（ＡＰＤ）による陽電子の検出，ＫＥＫ Ｐｒｏｃｅｅｄｉｎｇｓ，日本，１９９８年１１月１３日，９８−６，ｐ．２１−２３
Attorney, Agent or Firm:
Kosaku Sugimura