Title:
APPARATUS AND METHOD FOR INSPECTING FLAT PANEL DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP2004294271
Kind Code:
A
Abstract:
To eliminate focal deviation and inspection position deviation of a camera at inspection on display quality and to perform highly accurate inspection with a simple constitution in an apparatus and a method for inspecting a flat panel display device.
Display defects are inspected by arranging a flat panel display device 1, an object to be inspected, in the inspection apparatus in such a way that the normal to a display surface of the flat panel display device 1 is perpendicular to the direction of gravitation.
Inventors:
TAGUCHI TOSHIHIRO
Application Number:
JP2003087167A
Publication Date:
October 21, 2004
Filing Date:
March 27, 2003
Export Citation:
Assignee:
JAPAN SCIENCE & TECH AGENCY
SAKURAI ENGINEERING KK
SAKURAI ENGINEERING KK
International Classes:
G01B11/30; G01M11/00; G02F1/13; G09F9/00; (IPC1-7): G01M11/00; G01B11/30; G02F1/13; G09F9/00
Attorney, Agent or Firm:
Manabe Kiyoshi