Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
APPARATUS AND METHOD FOR INSPECTION OF PRODUCT AS WELL AS MANUFACTURING METHOD FOR PRODUCT BY USING PRODUCT INSPECTION APPARATUS
Document Type and Number:
Japanese Patent JP2002139445
Kind Code:
A
Abstract:

To provide an apparatus and a method, for the inspection of a product, wherein, when the product in a convexo-concave shape is inspected, the product can be inspected with high inspection accuracy without changing an evaluation criterion even when the transmission amount or the reflection amount of light is changed due to the shape of the product and to provide a manufacturing method in which the product of high appearance quality can be manufactured.

The product inspection apparatus is constituted of imaging means 1, 4 which generate optical images of the product 101 as a specimen, spectral sensors 2, 3 which spectrally diffract the optical image in a prescribed part from among the optical images generated by the imaging means so as to be converted into spectrum signals corresponding to a wavelength, a spectrum-signal correction part 200 which corrects the spectrum signals detected by the spectral sensors, a signal computing part 5 which computes color tone information on the basis of the corrected spectrum signals and an inspection-result computing part 8 which inspects the product on the basis of output data from the signal computing part 5 and on the basis of the evaluation criterion 6 which is input in advance.


Inventors:
SUNAGA KOHEI
OSADA NORIKO
TAKESHIMA YOICHI
Application Number:
JP2000330885A
Publication Date:
May 17, 2002
Filing Date:
October 30, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI ELECTRIC CORP
MITSUBISHI ELECTRIC ENG
International Classes:
G01B11/06; G01B11/30; G01J3/46; G01J3/50; G01N21/89; (IPC1-7): G01N21/89; G01B11/06; G01B11/30; G01J3/46; G01J3/50
Attorney, Agent or Firm:
Kaneo Miyata (1 person outside)