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Patent Searching and Data


Title:
APPARATUS AND METHOD FOR IONIZED FILM DEPOSITION
Document Type and Number:
Japanese Patent JP2002053955
Kind Code:
A
Abstract:

To deposit film on a low heat resistant material such as resin substrate by using an ionized film deposition method independently of the material of the substrate.

The film deposition system has a film deposition chamber 1 having an exhaust system, a gas-introducing means 5 for introducing process gas into the film deposition chamber 1, and a target 2 arranged in the film deposition chamber 1, and particles sputtered from the target 2 are deposited onto the surface of a substrate 7. Moreover, this apparatus has an ionization mechanism 6 for ionizing the sputtered particles and a leading-in electrode 10 for forming an electric field so that the ionized particles can be made incident upon the substrate 7 efficiently, and further, a thermal shield structure 60g is provided in order to prevent the direct radiation of heat generated from the ionization mechanism 6 to the substrate 7. Because the rise in the temperature of the substrate 7 on which the ionized particles are to be deposited can be suppressed with certainty, film deposition onto the substrate having low heat resistance temperature is made possible.


Inventors:
OYA KATSUNORI
YAMAGUCHI HIROTO
KOIKE ATSUSHI
KANAI MASAHIRO
Application Number:
JP2000237318A
Publication Date:
February 19, 2002
Filing Date:
August 04, 2000
Export Citation:
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Assignee:
CANON KK
International Classes:
C23C14/34; H01L21/203; H01L21/285; (IPC1-7): C23C14/34; H01L21/203; H01L21/285
Attorney, Agent or Firm:
Kokubun Takaetsu