To solve a problem that since a fault to be detected is extracted by reference to even toggle information 3 regarding an element in a semiconductor circuit to which a toggle event is not propagated, and a fault which has no possibility of being actually detected is extracted as an object for detection to perform unnecessary simulation.
A fault simulation apparatus is provided with a toggle event propagation check part 14 which extracts an element in the circuit to which the toggle event is propagated by reference to toggle information 13 outputted from a toggle simulation part 12 and faults to be detected by simulation are listed up from toggle propagation information 15 regarding the element extracted by the toggle event propagation check part 14.
Konobu Kato
Hideaki Tazawa
Hamada Hatsune
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