Title:
APPARATUS FOR TEA LEAF COMPONENT ANALYSIS
Document Type and Number:
Japanese Patent JP2001349827
Kind Code:
A
Abstract:
To develop an apparatus for a novel tea leaf component analysis, in which a structure related to the irradiation of tear leaves with near-infrared rays and the discharge of tea leaves taken in as a sample is constituted more rationally.
A tea leaf receiving part 5 is fixed to a machine frame F, and tea leaves A are discharged from the tea leaf receiving part 5 by moving a push-out side plate 55 along the surface of a translucent plate 52. Since only a near-infrared ray irradiation device 2 is moved without having to move the teal leaf receiving part 5, the structure of the apparatus for tea leaf component analysis is made compact and simple, and production cost can be reduced.
Inventors:
UCHIDA TAIZAN
WADA KATSUYOSHI
WADA KATSUYOSHI
Application Number:
JP2000170767A
Publication Date:
December 21, 2001
Filing Date:
June 07, 2000
Export Citation:
Assignee:
KAWASAKI KIKO KK
International Classes:
G01N21/11; A23F3/06; G01N21/01; G01N21/27; (IPC1-7): G01N21/27; A23F3/06; G01N21/01; G01N21/11
Attorney, Agent or Firm:
Takahiko Higashiyama
Previous Patent: FINE FLOW CHANNEL ELEMENT
Next Patent: METHOD FOR MEASURING TRACE METAL CARBONYL COMPOUND, AND APPARATUS FOR COLLECTING SAME
Next Patent: METHOD FOR MEASURING TRACE METAL CARBONYL COMPOUND, AND APPARATUS FOR COLLECTING SAME