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Patent Searching and Data


Title:
APPARATUS FOR TESTING INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPH01140083
Kind Code:
A
Abstract:

PURPOSE: To evaluate the frequency characteristic of a switched capacitor filter (SCF) circuit part and to reduce product cost, by inputting a square wave of a determined cycle to the SCF circuit part and discriminating the change of output voltage.

CONSTITUTION: Switches 51, 52 are connected so as to test an analogue circuit part 3 and switches 61, 62 are connected so that an SCF circuit part 4 is connected to a digital tester 5 in a continuity state. Then, a square wave is inputted to the input terminal 41 of the circuit part 4 from the tester 5 through the switches 51, 61. When the internal circuit of the circuit part 4 is normal and the frequency of the square wave is present in the pass-band of the circuit part 4, a sine wave having frequency corresponding to the output waveform thereof is outputted. Said sine wave is sampled at a definite time interval by the tester 5 and high level reference voltage or more is judged to be 1 and below low level reference voltage is judged to be 0 and a range from below high level reference voltage to low level reference voltage is judged to be indefinite. When frequency is within the cut-off region of the circuit part 4, the width between the bias voltage value of the circuit part 4 and a reference voltage value is preset to 1/21/2 the amplitude of the output voltage value of the pass-band frequency thereof.


Inventors:
HIROSE YUKIKAZU
YAGO MASATOSHI
Application Number:
JP29844887A
Publication Date:
June 01, 1989
Filing Date:
November 26, 1987
Export Citation:
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Assignee:
MATSUSHITA ELECTRONICS CORP
International Classes:
G01R31/26; G01R31/28; H01L21/66; G01R31/316; (IPC1-7): G01R31/28; H01L21/66
Domestic Patent References:
JPS5426144A1979-02-27
JPS57157164A1982-09-28
Attorney, Agent or Firm:
Akira Kobiji (2 outside)