Title:
POSITION/ ATTITUDE MEASURING INSTRUMENT AND POSITION/ ATTITUDE MEASURING METHOD
Document Type and Number:
Japanese Patent JP3871980
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a position/attitude measuring instrument and a position/ attitude measuring method excelling in movement stability and in space saving, and potentiating the input of a position on a display, a distance from the display, and rotation, at arbitrary measurement time intervals and over a wide area.
SOLUTION: In this position/attitude measuring instrument, light from luminescent spots displayed on a luminescent spot scan surface of the display 11 is condensed and projected as spot beams to a light receiving surface of a light receiver 12. The spot beams projected to prescribed two points on the receiving surface of the light receiver 12 are received by two photo acceptance elements disposed at prescribed two points on the receiving surface of the light receiver to convert optical power into electrical signals. The positions of the two luminescent spots on the scan surface of the display are found corresponding to these spot beams. The position and attitude of the light receiver are found relative to the scan surface based on the positions of the prescribed two points on the receiving surface and on the positions of the two luminescent spots on the scan surface.
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Inventors:
Akira Kato
Application Number:
JP2002225316A
Publication Date:
January 24, 2007
Filing Date:
August 01, 2002
Export Citation:
Assignee:
Nippon Telegraph and Telephone Corporation
International Classes:
G01B11/00; G01B11/26; (IPC1-7): G01B11/00
Domestic Patent References:
| JP2001175405A | ||||
| JP9325007A |
Attorney, Agent or Firm:
Yoshikazu Tani
Kazuo Abe
Kazuo Abe