Title:
AUTOMATIC FLAW DETECTING DEVICE
Document Type and Number:
Japanese Patent JP3191397
Kind Code:
B2
Abstract:
PURPOSE: To efficiently detect flaws with high precision without requiring a large facility space in an automatic flaw detecting device detecting the surface flaws based on a pickup image photographed with the surface of a specimen.
CONSTITUTION: A rotatable reflecting mirror 44 and a television camera 46 photographing the surface 18 of a specimen 12 via the reflecting mirror 44 are arranged on a bogie 28 moved in parallel with the surface 18 of the specimen 12. The rotation of the reflecting mirror 44 is controlled in response to the moving speed of the bogie 28 so that the surface 18 can be photographed in nearly the static image state regardless of the movement of the bogie 28.
Inventors:
Kenichi Takada
Taizo Yano
Taizo Yano
Application Number:
JP10042592A
Publication Date:
July 23, 2001
Filing Date:
March 26, 1992
Export Citation:
Assignee:
Daido Steel Co., Ltd.
International Classes:
G01B11/30; G01N21/89; G01N21/892; G01N21/91; G01N27/84; H04N7/18; (IPC1-7): G01N21/892; G01B11/30; G01N21/91; G01N27/84
Domestic Patent References:
| JP5168286A | ||||
| JP465660A | ||||
| JP62148844A | ||||
| JP59174275A |
Attorney, Agent or Firm:
Haruyuki Ikeda (2 outside)