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Title:
深層学習を用いた自動的な画像ベースの皮膚診断
Document Type and Number:
Japanese Patent JP7395604
Kind Code:
B2
Abstract:
There is shown and described a deep learning based system and method for skin diagnostics as well as testing metrics that show that such a deep learning based system outperforms human experts on the task of apparent skin diagnostics. Also shown and described is a system and method of monitoring a skin treatment regime using a deep learning based system and method for skin diagnostics.

Inventors:
Jean Luo Wei
Ma Jun Wei
Mar Hee
El Mosnino Eric
Kezel Irina
Levinstein Alex
Despore Julian
Perot Matthew
Flemish Frederick Antonin Raymond Surge
Arrabi Param
Application Number:
JP2021554782A
Publication Date:
December 11, 2023
Filing Date:
December 03, 2019
Export Citation:
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Assignee:
Jean Luo Wei
Ma Jun Wei
Mar Hee
El Mosnino Eric
Kezel Irina
Levinstein Alex
Despore Julian
Perot Matthew
Flemish Frederick Antonin Raymond Surge
Arrabi Param
International Classes:
G06T7/00; A61B10/00; G06N3/04
Domestic Patent References:
JP2016148906A
Foreign References:
WO2017165363A1
US20180130203
Other References:
Xulei Yang et al.,SkinLesion Analysis by Multi-Target Deep Neural Networks,[online],2018年,https://ieeexplore.ieee.org/document/8512488
Attorney, Agent or Firm:
Patent Attorney Corporation Shinmei Century