Title:
BALL SPHERICITY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP3938074
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To properly and simply conduct inspection, to enhance reliability of a determination result, and to avoid lowering of quality caused by damage of a ball, in a ball sphericity inspection device for inspecting the sphericity of the various balls such as a nonferrous ball for plating.
SOLUTION: A ball noncontact suction device 22 is provided with a suction face 22b formed along a surface of the ball 40, and a supply port 22c formed to be opened in the central part of the suction face 22b. Air is supplied from the supply port 22c to a clearance between the suction face 22b and the ball 40 at a high velocity to generate negative pressure, and the ball 40 is thereby sucked to the suction face 22b noncontactly. This inspection device is provided with a pressure measuring instrument 35 for detecting pressure fluctuation in the clearance between the suction face 22b and the ball 40, and a determination part 36 for determining the quality of the sphericity of the ball 40 based on the pressure fluctuation.
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Inventors:
Nobuhiko Ishikawa
Kazuhiro Matsushita
Kazuhiro Matsushita
Application Number:
JP2003062991A
Publication Date:
June 27, 2007
Filing Date:
March 10, 2003
Export Citation:
Assignee:
Mitsubishi Materials Techno Co., Ltd.
International Classes:
G01B13/16; (IPC1-7): G01B13/16
Attorney, Agent or Firm:
Chiharu Shimizu