Title:
基材処理装置および検出方法
Document Type and Number:
Japanese Patent JP7126976
Kind Code:
B2
Abstract:
A base material processing apparatus includes a first detector, a second detector, and an arithmetic unit. The first detector intermittently detects the position of the edge of the base material in the width direction at a first detection position to acquire a first detection result (Ra). The second detector intermittently detects the position of the edge of the base material in the width direction at a second detection position located downstream of the first detection position to acquire a second detection result (Rb). The arithmetic unit calculates a transport error of the base material by comparison between the first detection result (Ra) and the second detection result (Rb). The controller changes detection timing of at least one of the first detector and the second detector.
Inventors:
Mitsuhiro Yoshida
Ryuji Yamamoto
Kazuki Fukui
Ryuji Yamamoto
Kazuki Fukui
Application Number:
JP2019060170A
Publication Date:
August 29, 2022
Filing Date:
March 27, 2019
Export Citation:
Assignee:
Screen Holdings Co., Ltd.
International Classes:
B65H23/188; B41J2/01; B41J11/42
Domestic Patent References:
JP201688654A | ||||
JP201655570A | ||||
JP2008155628A | ||||
JP200691384A | ||||
JP2003182896A |
Attorney, Agent or Firm:
Takami Nishida
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